Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Chinese Journal of Lasers, Volume. 51, Issue 7, 0701008(2024)

Extreme Ultraviolet Detectors: A Review

Wei Zheng*, Naiji Zhang, Siqi Zhu, Lixin Zhang, and Wei Cai
Author Affiliations
  • State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials, Sun Yat-sen University, Shenzhen 518107, Guangdong, China
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (9)
    Equations (0)
    References (141)
    Cited By (2)
    Tools
    Paper Information
    Topics
    Cited By

    Article index updated: Sep. 7, 2025

    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
    Tools

    Get Citation

    Copy Citation Text

    Wei Zheng, Naiji Zhang, Siqi Zhu, Lixin Zhang, Wei Cai. Extreme Ultraviolet Detectors: A Review[J]. Chinese Journal of Lasers, 2024, 51(7): 0701008

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: laser devices and laser physics

    Received: Dec. 25, 2023

    Accepted: Mar. 18, 2024

    Published Online: Apr. 17, 2024

    The Author Email: Wei Zheng (zhengw37@mail.sysu.edu.cn)

    DOI:10.3788/CJL231569

    CSTR:32183.14.CJL231569

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology