Chinese Journal of Lasers, Volume. 31, Issue 6, 701(2004)

Influence of Deposition Temperature on the Properties of ZrO2 Films Prepared by Electron Beam Evaporation

[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(10)

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    [3] [3] J. S. Kim, H. A. Marzouk, P. J. Reucroft. Deposition and structural characterization of ZrO2 and yttria-stabilized ZrO2 films by chemical vapor deposition [J]. Thin Solid Films, 1995, 254:33~38

    [4] [4] R. Guinebretiere, B. Soulestin, A. Dauger. XRD and TEM study of heteroepotaxial growth of zirconia on magnesia single crystal [J]. Thin Solid Films, 1998, 319:197~201

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    [7] [7] M. Boulouz, A. Boulouz, A. Giani et al.. Influence of substrate temperature and target composition on the properties of yitta-stabilized thin films grown by r.f. reactive magnetron sputtering [J]. Thin Solid Films, 1998, 323:85~92

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Influence of Deposition Temperature on the Properties of ZrO2 Films Prepared by Electron Beam Evaporation[J]. Chinese Journal of Lasers, 2004, 31(6): 701

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    Paper Information

    Category: materials and thin films

    Received: Apr. 18, 2003

    Accepted: --

    Published Online: Jun. 12, 2006

    The Author Email: (shaoshuying@mail.siom.ac.cn)

    DOI:

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