Particle Size and Refractive Index Measurement Based on the Polarization Distribution Difference of Scattered Light

Chenyu Zhang; Qieni Lü; Fugen Zhang

doi:10.3788/AOS202141.1929001

Acta Optica Sinica, Volume. 41, Issue 19, 1929001(2021)

Particle Size and Refractive Index Measurement Based on the Polarization Distribution Difference of Scattered Light

Chenyu Zhang^1,2, Qieni Lü^1,2、*, and Fugen Zhang³

Author Affiliations

¹School of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China

²Key Laboratory of the Ministry of Education on Optoelectronic Information Technology, Tianjin 300072, China

³Zhuhai Linkoptik Instrument Co., Ltd., Zhuhai, Guangdong 519085, China

show less

Abstract Get PDF(in Chinese)

Figures & Tables(10)

Fig. 1. Mie scattered light intensity distributions. (a) D＝1 μm, m＝1.6; (b) D＝1 μm, m＝1.2; (c) D＝5 μm, m＝1.6

Download full size

Fig. 2. Scattered light energy distributions. (a) E_//， $E_{//}^{(60, 3)}$ , and $E_{//}^{(45, 3)}$ ；(b) the difference between E_// and $E_{//}^{(60, 3)}$ ; (c) the difference between E_// and $E_{//}^{(45, 3)}$

Download full size

Fig. 3. Fitting residual curves. (a) m_im＝0; (b) m_im＝0.01; (c) m_im＝0.1; (d) m_im＝1

Download full size

$Flow chart of PDSL method to measure the refractive index of particles$

Fig. 4. Flow chart of PDSL method to measure the refractive index of particles

Download full size

Fig. 5. Simulated measurement results

Download full size

Fig. 6. Simulated measurement results of LT2200 laser particle sizer

Download full size

Fig. 7. Schematic of optical path of laser particle sizer

Download full size

Fig. 8. Measurement results of standard sample D₅₀

Download full size

Fig. 9. Particle size distributions of samples. (a) Silicon carbide; (b) Graphite

Download full size

Table 1. Particle size distributions of silicon carbide and graphite samples calculated by m₂ and $m_{2}^{'}$

View table

Table 1. Particle size distributions of silicon carbide and graphite samples calculated by m₂ and $m_{2}^{'}$

Sample	Value by m₂			Value by $m_{2}^{'}$			Relative error
Sample	D₁₀ /μm	D₅₀ /μm	D₉₀ /μm	D₁₀ /μm	D₅₀ /μm	D₉₀ /μm	r₁₀ /%	r₅₀ /%	r₉₀ /%
Silicon carbide	0.91	1.27	1.48	0.92	1.26	1.48	1.09	0.79	0
Graphite	5.87	14.17	27.97	5.89	14.16	27.98	0.34	0.07	0.04

Tools

Get Citation

Copy Citation Text

Chenyu Zhang, Qieni Lü, Fugen Zhang. Particle Size and Refractive Index Measurement Based on the Polarization Distribution Difference of Scattered Light[J]. Acta Optica Sinica, 2021, 41(19): 1929001

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Scattering

Received: Feb. 24, 2021

Accepted: Apr. 21, 2021

Published Online: Oct. 9, 2021

The Author Email: Lü Qieni (qienil@tju.edu.cn)

DOI:10.3788/AOS202141.1929001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Particle size distributions of silicon carbide and graphite samples calculated by m2 and m2'

Table 1. Particle size distributions of silicon carbide and graphite samples calculated by m2 and m2'

Table 1. Particle size distributions of silicon carbide and graphite samples calculated by m₂ and $m_{2}^{'}$

Table 1. Particle size distributions of silicon carbide and graphite samples calculated by m₂ and $m_{2}^{'}$