High Power Laser and Particle Beams, Volume. 34, Issue 6, 063003(2022)

Circuit simulation of GJB151B CS115 part П: The analysis of application

Zhitong Cui*, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, and Zheng Liu
Author Affiliations
  • State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
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    To design the test setup and predict the effect of GJB151B CS115 “impulse excitation bulk cable injection conducted susceptibility”, we introduced the circuit model of inductive pulse current injection for different type of cables. The influences on the injected voltage/current caused by the factors of the test setup are simulated and analyzed. Some regularity characteristics of CS115 test setting are summarized, and the method of CS115 test design and optimization by circuit simulation is proposed.

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    Zhitong Cui, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, Zheng Liu. Circuit simulation of GJB151B CS115 part П: The analysis of application[J]. High Power Laser and Particle Beams, 2022, 34(6): 063003

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    Paper Information

    Category: High Power Microwave Technology

    Received: Nov. 19, 2021

    Accepted: --

    Published Online: Jun. 2, 2022

    The Author Email: Zhitong Cui (zhitong_cui@163.com)

    DOI:10.11884/HPLPB202234.210499

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