Laser & Optoelectronics Progress, Volume. 50, Issue 10, 101001(2013)
Variable Step Detection of Product Surface Defect Based on Optimal Identification Interval
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Xu Qing, Han Yueping, Yang Zhigang, Sun Baohua. Variable Step Detection of Product Surface Defect Based on Optimal Identification Interval[J]. Laser & Optoelectronics Progress, 2013, 50(10): 101001
Paper Information
Category: Image Processing
Received: May. 12, 2013
Accepted: --
Published Online: Sep. 4, 2013
The Author Email: Xu Qing (sizhuqingsci@163.com)
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