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Photonics Research, Volume. 7, Issue 11, B73(2019)

Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films

C. Trager-Cowan1、*, A. Alasmari1, W. Avis1, J. Bruckbauer1, P. R. Edwards1, B. Hourahine1, S. Kraeusel1, G. Kusch1, R. Johnston1, G. Naresh-Kumar1, R. W. Martin1, M. Nouf-Allehiani1, E. Pascal1, L. Spasevski1, D. Thomson1, S. Vespucci1, P. J. Parbrook2, M. D. Smith2, J. Enslin3, F. Mehnke3, M. Kneissl3,4, C. Kuhn3, T. Wernicke3, S. Hagedorn4, A. Knauer4, V. Kueller4, S. Walde4, M. Weyers4, P.-M. Coulon5, P. A. Shields5, Y. Zhang6, L. Jiu6, Y. Gong6, R. M. Smith6, T. Wang6, and A. Winkelmann1,7
Author Affiliations
  • 1Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG, UK
  • 2Tyndall National Institute, University College Cork, Cork T12 R5CP, Ireland
  • 3Institute of Solid State Physics, Technische Universität Berlin, 10623 Berlin, Germany
  • 4Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, 12489 Berlin, Germany
  • 5Department of Electronic and Electrical Engineering, Centre of Nanoscience & Nanotechnology, University of Bath, Bath BA2 7AY, UK
  • 6Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, UK
  • 7Laser Components Department, Laser Zentrum Hannover e.V., 30419 Hannover, Germany
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    C. Trager-Cowan, A. Alasmari, W. Avis, J. Bruckbauer, P. R. Edwards, B. Hourahine, S. Kraeusel, G. Kusch, R. Johnston, G. Naresh-Kumar, R. W. Martin, M. Nouf-Allehiani, E. Pascal, L. Spasevski, D. Thomson, S. Vespucci, P. J. Parbrook, M. D. Smith, J. Enslin, F. Mehnke, M. Kneissl, C. Kuhn, T. Wernicke, S. Hagedorn, A. Knauer, V. Kueller, S. Walde, M. Weyers, P.-M. Coulon, P. A. Shields, Y. Zhang, L. Jiu, Y. Gong, R. M. Smith, T. Wang, A. Winkelmann, "Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films," Photonics Res. 7, B73 (2019)

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    Paper Information

    Special Issue: SEMICONDUCTOR UV PHOTONICS

    Received: Mar. 6, 2019

    Accepted: Aug. 28, 2019

    Published Online: Oct. 28, 2019

    The Author Email: C. Trager-Cowan (c.trager-cowan@strath.ac.uk)

    DOI:10.1364/PRJ.7.000B73

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology