Photonics Insights, Volume. 2, Issue 4, R08(2023)

Plasmon-induced hot carrier dynamics and utilization

Jian Luo1,2、†, Qile Wu1, Lin Zhou1、*, Weixi Lu1, Wenxing Yang2, and Jia Zhu1、*
Author Affiliations
  • 1National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Jiangsu Key Laboratory of Artificial Functional Materials, Key Laboratory of Intelligent Optical Sensing and Manipulation, Ministry of Education, Nanjing University, Nanjing, China
  • 2School of Physics and Optoelectronic Engineering, Yangtze University, Jingzhou, China
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    References(378)

    [68] P. Wissman, H.-U. Finzel. Electrical Resistivity of Thin Metal Films(2007).

    [70] U. V. Kreibig. Optical Properties of Metal Clusters(1995).

    [71] S. A. Maier. Plasmonics: Fundamentals and Apllications(2007).

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    Jian Luo, Qile Wu, Lin Zhou, Weixi Lu, Wenxing Yang, Jia Zhu, "Plasmon-induced hot carrier dynamics and utilization," Photon. Insights 2, R08 (2023)

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    Paper Information

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    Received: Sep. 13, 2023

    Accepted: Nov. 22, 2023

    Published Online: Dec. 21, 2023

    The Author Email: Lin Zhou (linzhou@nju.edu.cn), Jia Zhu (jiazhu@nju.edu.cn)

    DOI:10.3788/PI.2023.R08

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