All-optical up-conversion for 2.5-Gb/s signals in ROF systems based on FWM effect in HNLF

Tianliang Wang; Hongwei Chen; Shizhong Xie; Bouchaib Hraimel; Luo Ma; Xiupu Zhang

doi:10.3788/COL20100811.1037

Chinese Optics Letters, Volume. 8, Issue 11, 1037(2010)

All-optical up-conversion for 2.5-Gb/s signals in ROF systems based on FWM effect in HNLF

Tianliang Wang¹, Hongwei Chen¹, Shizhong Xie¹, Bouchaib Hraimel², Luo Ma², and Xiupu Zhang²

¹State Key Laboratory on Integrated Optoelectronics, Tsinghua National Laboratory for Information, Science, and Technology (TNList), Department of Electronic Engineering, Tsinghua University, Beijing 100084, China

²ENCS of Concordia University, Montreal, Canada

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CLP Journals

[1] Guo Jingzhong, Yu Jinlong, Wang Wenrui, Wu Bo, Han Bingchen, Wang Ju, Liu Yi, Yang Enze. Optical Frequency Up-Conversion by Injection Locking Semiconductor Laser with Directly Modulated Baseband Signal[J]. Chinese Journal of Lasers, 2012, 39(2): 205003

[2] Long Zheng, Xia Zhang, Xiaomin Ren, Huifang Ma, Lei Shi, Yamiao Wang, Yongqing Huang, "Dispersion flattened photonic crystal fiber with high nonlinearity for supercontinuum generation at 1.55 \mum," Chin. Opt. Lett. 9, 040601 (2011)

[3] Tuo Shi, Bing Xiong, Changzheng Sun, Yi Luo, "Study on the saturation characteristics of high-speed uni-traveling-carrier photodiodes based on field screening analysis," Chin. Opt. Lett. 9, 082302 (2011)

Cited By

[1] Xiupu Zhang, Bouchaib Hraimel, Ke Wu. Breakthroughs in Optical Wireless Broadband Access Networks. IEEE Photonics Journal, 3, 331(2011).

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Tianliang Wang, Hongwei Chen, Shizhong Xie, Bouchaib Hraimel, Luo Ma, Xiupu Zhang, "All-optical up-conversion for 2.5-Gb/s signals in ROF systems based on FWM effect in HNLF," Chin. Opt. Lett. 8, 1037 (2010)

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Paper Information

Received: Apr. 17, 2010

Accepted: --

Published Online: Dec. 3, 2010

The Author Email:

DOI:10.3788/COL20100811.1037

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology