Optical Technique, Volume. 47, Issue 2, 163(2021)
ALens design of high resolution line scan for oled screen defect detection
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CAO Weiwei, SUN Xun, AN Shuangxin, WUBin, Xie Tingan. ALens design of high resolution line scan for oled screen defect detection[J]. Optical Technique, 2021, 47(2): 163
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Received: May. 19, 2020
Accepted: --
Published Online: Sep. 9, 2021
The Author Email: Weiwei CAO (lm18186879256@163.com)
CSTR:32186.14.
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