Fig. 1. Optical path of point diffraction transient interferometer

Fig. 2. Schematic diagram of the shape of an elliptical pinhole. (a) Light path incident on the elliptical pinhole; (b) projection relationship between elliptical pinhole and circular pinhole

Fig. 3. Elliptical pinhole simulation analysis. (a) Simulation model; (b) wavefront error comparison between elliptical pinhole and circular pinhole; (c) short axis-wavefront error scan of elliptical pinhole; (d) wavefront error when the long axis deviates from the design length; (e) wavefront error when the incidence angle deviates from the design angle

Fig. 4. Schematic diagram of polarization phase shifting

Fig. 5. Imaging optical path. (a) 2D optical path model; (b) central field wave aberration; (c) Y=2 mm field wave aberration; (d) MTF and approximate ITF curves; (e) distortion curve

Fig. 6. Hindle ball measuring convex spherical surface. (a) Schematic diagram of optical path; (b) measurement area of measured mirror; (c) wave aberration

Fig. 7. Camera target light spots. (a) Low-magnification objective lens reference light is 1.82 mm off-axis; (b) low-magnification objective lens reference light is 18.2 μm off-axis; (c) high-magnification objective lens reference light is 73 μm off-axis; (b) high-magnification objective lens reference light is 0.7 μm off-axis