Laser & Infrared, Volume. 54, Issue 1, 92(2024)

Fitting-based temperature measurement for 3.2~3.4 μm infrared thermal imager

LI Guan-lin, FAN Yong-jie*, WANG Zheng-ji, and LIU Yu-yu
Author Affiliations
  • School of Science, Kunming University of Science and Technology, Kunming 650500, China
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    References(3)

    [8] [8] Dai S S, Yan X H, Zhang T Q. Study on high-precision temperature measurement of infrared imager[J]. Infrared Physics & Technology, 2010, 53(5): 396-398.

    [11] [11] Elmalem S, Marom E. All-optical athermalization of infrared imaging systems using thermally dependent binary phase masks[J]. Journal of Optics, 2016, 18(6): 065604.

    [12] [12] Moropoulou A, Avdelidis N P. Emissivity measurements on historic building materials using dual-wavelength infrared thermography[J]. Proceedings of SPIE-the International Society for Optical Engineering, 2001, 4360: 224-228.

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    LI Guan-lin, FAN Yong-jie, WANG Zheng-ji, LIU Yu-yu. Fitting-based temperature measurement for 3.2~3.4 μm infrared thermal imager[J]. Laser & Infrared, 2024, 54(1): 92

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    Paper Information

    Category:

    Received: Apr. 10, 2023

    Accepted: Apr. 22, 2025

    Published Online: Apr. 22, 2025

    The Author Email: FAN Yong-jie (fanyj1980@263.net)

    DOI:10.3969/j.issn.1001-5078.2024.01.013

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