Laser & Optoelectronics Progress, Volume. 54, Issue 2, 23401(2017)

Simulation Investigation on Suppression Ratio of Dynamic Gas Lock in Extreme Ultraviolet Lithography

Chen Jinxin1,2、*, Wang Yu1, and Xie Wanlu1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    Chen Jinxin, Wang Yu, Xie Wanlu. Simulation Investigation on Suppression Ratio of Dynamic Gas Lock in Extreme Ultraviolet Lithography[J]. Laser & Optoelectronics Progress, 2017, 54(2): 23401

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: X-Ray Optics

    Received: Oct. 8, 2016

    Accepted: --

    Published Online: Feb. 10, 2017

    The Author Email: Chen Jinxin (ashion@aoe.ac.cn)

    DOI:10.3788/lop54.023401

    Topics