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Acta Optica Sinica, Volume. 37, Issue 3, 318004(2017)

Aberration Characterization and Correction in Super-Resolution Localization Microscopy

Zhao Zeyu1,2、*, Zhang Zhaoning1,2, and Huang Zhenli1,2
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    Zhao Zeyu, Zhang Zhaoning, Huang Zhenli. Aberration Characterization and Correction in Super-Resolution Localization Microscopy[J]. Acta Optica Sinica, 2017, 37(3): 318004

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    Paper Information

    Received: Sep. 29, 2016

    Accepted: --

    Published Online: Mar. 8, 2017

    The Author Email: Zeyu Zhao (zzyhust0228@126.com)

    DOI:10.3788/aos201737.0318004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology