Effect of Relative Phase Delay Error of Quarter-Wave Plate on Measurement Accuracy of Birefringence Parameters in Polarization-Sensitive Full-Field Optical Coherence Tomography System

Shuanglu Zou; Wanrong Gao; Siyu Liu

doi:10.3788/LOP202259.1617003

Laser & Optoelectronics Progress, Volume. 59, Issue 16, 1617003(2022)

Effect of Relative Phase Delay Error of Quarter-Wave Plate on Measurement Accuracy of Birefringence Parameters in Polarization-Sensitive Full-Field Optical Coherence Tomography System

Shuanglu Zou, Wanrong Gao^*, and Siyu Liu

Author Affiliations

School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu , China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Sep. 7, 2025

The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Shuanglu Zou, Wanrong Gao, Siyu Liu. Effect of Relative Phase Delay Error of Quarter-Wave Plate on Measurement Accuracy of Birefringence Parameters in Polarization-Sensitive Full-Field Optical Coherence Tomography System[J]. Laser & Optoelectronics Progress, 2022, 59(16): 1617003

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Medical Optics and Biotechnology

Received: Aug. 13, 2021

Accepted: Aug. 27, 2021

Published Online: Aug. 8, 2022

The Author Email: Wanrong Gao (wgao@njust.edu)

DOI:10.3788/LOP202259.1617003

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology