Optimized Network Cost Approaches of Virtual Optical Network Mapping based on Mixed Line Rate

Bo-wen CHEN; Yao-hui WANG; Qi CHEN; Ming-yi GAO; Jin-bing WU

doi:10.13756/j.gtxyj.2022.06.001

Study On Optical Communications, Volume. 48, Issue 6, 1(2022)

Optimized Network Cost Approaches of Virtual Optical Network Mapping based on Mixed Line Rate

Bo-wen CHEN^1、*, Yao-hui WANG², Qi CHEN¹, Ming-yi GAO¹, and Jin-bing WU³

Author Affiliations

¹School of Electronic and Information Engineering, Soochow University, Suzhou 215006, China ;

²Wenzheng College of Soochow University, Suzhou 215104, China

³Technology Research Institute, Suzhou LZY Technology Co., Ltd., Suzhou 215153, China

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References(5)

[1] Cisco. Cisco Visual Networking Index: Forecast and Methodology[EB/OL]. https://newsroom.cisco.com/c/r/newsroom/en/us/a/y2017/m06/cisco-visual-networking-index-predicts-global-annual-ip-traffic-to-exceed-three-zettabytes-by-2021.html?dtid=osscdc00028

[2] Chen R H, Cao L H. China Internet Development Report 2019[EB/OL]. https://www.isc.org.cn/article/37331.html

[3] Chen B, Zhang J, Xie W et al. Cost-effective Survivable Virtual Optical Network Mapping in Flexible Bandwidth Optical Networks[J]. IEEE/OSA Journal of Lightwave Technology, 34, 2398-2412(2016).

[4] Chen Q, Lei Y, Zhang Q et al. A Profit-maximized Approach based on Link Importance Degree for Virtual Optical Networks Mapping[C], 1-3(2019).

[5] Nag A, Tornatore M M. Transparent Optical Network Design with Mixed Line Rates[C], 1-3(2018).

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Bo-wen CHEN, Yao-hui WANG, Qi CHEN, Ming-yi GAO, Jin-bing WU. Optimized Network Cost Approaches of Virtual Optical Network Mapping based on Mixed Line Rate[J]. Study On Optical Communications, 2022, 48(6): 1

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Paper Information

Category: Research Articles

Received: Nov. 26, 2021

Accepted: --

Published Online: Feb. 14, 2023

The Author Email: Bo-wen CHEN (bwchen@suda.edu.cn)

DOI:10.13756/j.gtxyj.2022.06.001

Topics

laser devices and laser physics

Lasers and Laser Optics

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laser manufacturing

Instrumentation, Measurement and Metrology