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Infrared and Laser Engineering, Volume. 44, Issue 10, 3130(2015)

Ultrafast pump-probe detection of X-ray induced transient optical reflectivity changes in GaAs

Wang Bo1,2,3, Bai Yonglin1,2, Xu Peng2, Gou Yongsheng2,3, Zhu Bingli2, Bai Xiaohong1, Liu Baiyu2, and Qin Junjun1
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Wang Bo, Bai Yonglin, Xu Peng, Gou Yongsheng, Zhu Bingli, Bai Xiaohong, Liu Baiyu, Qin Junjun. Ultrafast pump-probe detection of X-ray induced transient optical reflectivity changes in GaAs[J]. Infrared and Laser Engineering, 2015, 44(10): 3130

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    Paper Information

    Category: 超快光学

    Received: Feb. 6, 2015

    Accepted: Mar. 7, 2015

    Published Online: Jan. 26, 2016

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology