Polarization scattering characteristics analysis of rough dihedral angle at terahertz frequencies

ZHENG Yuqing; XU Zhiming; WU Qihua; LIU Xiaobin; HAO Xiaojun; AI Xiaofeng

doi:10.11805/tkyda2023435

Journal of Terahertz Science and Electronic Information Technology , Volume. 23, Issue 5, 495(2025)

Polarization scattering characteristics analysis of rough dihedral angle at terahertz frequencies

ZHENG Yuqing¹, XU Zhiming^1、*, WU Qihua¹, LIU Xiaobin¹, HAO Xiaojun², and AI Xiaofeng¹

Author Affiliations

¹College of Electronic Science and Technology, National University of Defense Technology, Hunan Changsha 410073, China

²State Key Laboratory of Complex Electronmagnetic Environment Effect on Electronics & Information System, Luoyang Henan 471003, China

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ZHENG Yuqing, XU Zhiming, WU Qihua, LIU Xiaobin, HAO Xiaojun, AI Xiaofeng. Polarization scattering characteristics analysis of rough dihedral angle at terahertz frequencies[J]. Journal of Terahertz Science and Electronic Information Technology , 2025, 23(5): 495

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Paper Information

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Received: Dec. 25, 2023

Accepted: Jun. 5, 2025

Published Online: Jun. 5, 2025

The Author Email: XU Zhiming (zmxu_nudt@163.com)

DOI:10.11805/tkyda2023435

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology