Fig. 1. Surficial and sectional SEM images of n-type CdTe thin film with deposition time（a）15 min，（b）20 min，（c）25 min，（d）30 min，（e）20 min，（f）30 min.

Fig. 2. XRD patterns of n-typeCdTe thin film with deposition time（a）15 min，（b）20 min，（c）25 min，（d）30 min

Fig. 3. Diffuse reflection spectra of n-type CdTe thin film with deposition time（a）UV-Vis diffuse reflection spectra，（b）band-gap spectra

Fig. 4. XPS spectrum of n-type CdTe thin film（a）full spectrum，（b）Cd_3d，_{（c）TeO2，（d）Te3d}

Fig. 5. PEC properties of n-type CdTe thin film measured in different solution（a）I-V，（b）I-T

Fig. 6. PEC properties of n-type CdTe thin film deposited with different time（a）I-V，（b）I-T.

Fig. 7. （a）Schematic diagram of equivalent circuit of electrolytic cell，（b）schematic diagram of simplified equivalent circuit，（c）simple schematic diagram of Nyqusit diagram calculation R_u，R_ct，C_d；PEC curves of n-type CdTe thin film deposited with different time（d）Nyquist spectrum，（e）MS spectrum

Fig. 8. PEC properties of n-type CdTe thin film annealed with different temperatures in a vacuum（a）I-V，（b）I-T

Fig. 9. PEC properties of n-type CdTe thin film annealed in different conditions（a）I-V，（b）I-T.

Fig. 10. EDS mapping of O in n-type CdTe thin film annealed in different conditions（a）annealed in vacuum，（b）CdCl₂ coated n-type CdTe annealed in vacuum，（c）annealed in N₂ atmosphere