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Laser & Optoelectronics Progress, Volume. 62, Issue 3, 0312006(2025)

High Uniformity Light Source for Contact Angle Measurement Based on Particle Swarm Optimization Algorithm

Jiaxian Zhang1、*, Jun Wang2,3, and Zhaoliang Cao1,3
Author Affiliations
  • 1School of Physical Science and Technology, Suzhou University of Science and Technology, Suzhou 215009, Jiangsu , China
  • 2School of Electronic & Information Engineering, Suzhou University of Science and Technology, Suzhou 215009, Jiangsu , China
  • 3State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, Jilin , China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (16)
    Equations (8)
    References (14)
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    Paper Information
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    Figures & Tables(16)
    Structure diagram of image measurement system

    Fig. 1. Structure diagram of image measurement system

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    Improved PSO algorithm flow chart

    Fig. 2. Improved PSO algorithm flow chart

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    Optimized LED array distribution

    Fig. 3. Optimized LED array distribution

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    Illuminance distribution map and color mapping

    Fig. 4. Illuminance distribution map and color mapping

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    Overall flow chart of light source control module

    Fig. 5. Overall flow chart of light source control module

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    PCB

    Fig. 6. PCB

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    Circuit PCB board physical map and labeling

    Fig. 7. Circuit PCB board physical map and labeling

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    Optical path diagram of contact angle measurement

    Fig. 8. Optical path diagram of contact angle measurement

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    Side view of contact angle measuring instrument

    Fig. 9. Side view of contact angle measuring instrument

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    LED arrangement physical map

    Fig. 10. LED arrangement physical map

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    Contact angle to capture objects and measurement results. (a) Contact angle taken on substrate 1; (b) measurements of contact angle taken on substrate 1; (c) contact angle taken on substrate 2; (d) measurements of contact angle taken on substrate 2

    Fig. 11. Contact angle to capture objects and measurement results. (a) Contact angle taken on substrate 1; (b) measurements of contact angle taken on substrate 1; (c) contact angle taken on substrate 2; (d) measurements of contact angle taken on substrate 2

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    Measured values of contact angles and corresponding curves after 100 times measurement. (a) 30 °; (b) 60 °; (c) 90 °; (d) 120 °

    Fig. 12. Measured values of contact angles and corresponding curves after 100 times measurement. (a) 30 °; (b) 60 °; (c) 90 °; (d) 120 °

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    Relative error diagram of measurement results

    Fig. 13. Relative error diagram of measurement results

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    Comparison of gray-scale image and gray-scale histogram of each angle; (a) 30°; (b) 60°; (c) 90°; (d) 120 °

    Fig. 14. Comparison of gray-scale image and gray-scale histogram of each angle; (a) 30°; (b) 60°; (c) 90°; (d) 120 °

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    • Table 1. Improved PSO algorithm initialization parameters

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      Table 1. Improved PSO algorithm initialization parameters

      ParameterValue
      Lambert radiator1
      Chaotic mapping parameter4
      Species quantity20
      Limiting number of iterations200
      w /m0.15
      Size of receiving plane /(m×m)0.06×0.06
      ωmax， ωmin， c1 and c20.9， 0.4， results of Eqs. （7） and （8）
      ILED0 /mcd1000

    • Table 2. Comparison of experimental variance and mean square error

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      Table 2. Comparison of experimental variance and mean square error

      Experiment nameVarianceMean square error
      Experimental group 10.1869720100.432402602
      Experimental group 20.2072545240.455252154
      Experimental group 30.2611985250.511075851
      Experimental group 40.2369318580.486756467
      Control group 10.2064325740.454348516
      Control group 20.2346465640.484403307
      Control group 30.2639542450.513764776
      Control group 40.2578468280.507786203
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    Jiaxian Zhang, Jun Wang, Zhaoliang Cao. High Uniformity Light Source for Contact Angle Measurement Based on Particle Swarm Optimization Algorithm[J]. Laser & Optoelectronics Progress, 2025, 62(3): 0312006

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 22, 2024

    Accepted: Jun. 4, 2024

    Published Online: Feb. 10, 2025

    The Author Email:

    DOI:10.3788/LOP241133

    CSTR:32186.14.LOP241133

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology