Acta Optica Sinica, Volume. 20, Issue 8, 1015(2000)
Study of Bistable Characteristics of Long External Cavity Semiconductor Lasers Using Expression of Threshold Carrier Density
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of Bistable Characteristics of Long External Cavity Semiconductor Lasers Using Expression of Threshold Carrier Density[J]. Acta Optica Sinica, 2000, 20(8): 1015
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