[1] [1] Pan Yongqiang, Hang Lingxia, Wu Zhensen et al.. Influence of ion beam post-treatment on surface roughness of TiO2 thin films［J］. Chinese J. Lasers, 2010, 37(4): 1108～1113

[2] [2] Zhang Yun, Shen Yue, Gu Feng et al.. Influence of ions doping on the optical properties of mesoporous TiO2 thin films［J］. Acta Optica Sinica, 2010, 30(6): 1841~1845

[3] [3] S. Sakthivle, M. V. Shankar, M. Palanichamy et al.. Enhancement of photocatalytic activity by metal deposition: characterisation and photonic efficiency of Pt, Au and Pd deposited on TiO2 catalyst［J］. Water Res., 2004, 38(5): 3001～3008

[4] [4] Li Yun, Wang Liuding. Study on refractive index of TiO2 film prepared by electron beam evaporation［J］. Vacuum., 2008, 45(5): 35～37

[5] [5] Qi Hongji, Wang Qingyun, Xiao Xiudi et al.. Determination of structural parameters for obliquely deposited sculptured thin film［J］. Acta Optica Sinica, 2010, 30(1): 287～293

[6] [6] T. G. Knorr, R. W. Hoffman. Dependence of geometric magnetic anisotropy in thin iron films ［J］. Phys. Rev., 1959, 113(4): 1039～1046

[7] [7] Huang Yong, Cao Yiming, Wei Hong et al.. Theoretical analysis and application research of optical film with oblique evaporation［J］. J. Chongqing University of Science and Technology (Natural Sciences Edition), 2010, 12(3): 189～191

[8] [8] K. Robbie, M. J. Brett. Sculptured thin films and glancing angle deposition: growth and applications［J］. J. Vac. Sci. Technol. A, 1997, 15(3): 1460～1465

[9] [9] K. Robbie, C. Shafai, M. J. Brett. Thin films with nanometer-scale pillar microstructure［J］. J. Mater. Res., 1999, 14(7): 3158～3163

[10] [10] S. R. Kennedy, M. J. Brett. Porous broadband antireflection coating by glancing angle deposition［J］. Appl. Opt., 2003, 42(22): 4573～4579

[11] [11] Shen Zicai, Shao Jianda, Wang Yingjian et al.. Theoretical study of graded-index coatings prepared by glancing angle deposition［J］. Acta Physica Sinica, 2002, 54(7): 3069～3074

[12] [12] J. Q. Xi, M. F. Schubert, J. K. Kim et al.. Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection［J］. Nature Photonics, 2007, 1(3): 176～179

[13] [13] Pan Yongqiang, Wu Zhensen, Hang Lingxia et al.. Study on the interface roughness of multilayer dielectric optical thin film ［J］. Infrared and Laser Engineering, 2009, 38(3): 433～436

[14] [14] Pan Yongqiang, Wu Zhensen, Hang Lingxia. Optical thin films interfaces roughness cross-correlated properties and light scattering［J］. Chinese J. Lasers, 2008, 35(6): 916～920