[1] [1] Yang Lihong, Wang Tao, Su Junhong, et al.. Influence of laser conditioning on the damage properties of HfO2 thin film[J]. Acta Optica Sinica, 2013, 33(12): 1231001.

[2] [2] Wu Zhouling, Tang Jinfa, Shi Boxuan. Measurement of weak absorption of optical coatings by transverse photothermal deflection technique[J]. Acta Optica Sinica, 1988, 8(9): 1044-1047.

[3] [3] Dai Fu, Xiong Shengming, Gao Weidong. Temperature rise of optical coating irradiated by a high repetition frequency pulse laser[J]. Acta Physica Sinica, 2008, 37(3): 509-512.

[4] [4] Jin Tao, Jiang Shaoji. Laser damage issues of optical coating for the mid-infrared[J]. Infrared and Laser Engineering, 2007, 36(5): 680-683.

[5] [5] Sparks M. Optical distortion by heated windows in high power laser system[J]. Appl Phys, 1971, 42(12): 5029-5046.

[6] [6] Cui Xiao, Tao Chunxian, Hong Ruijin, et al.. Influence of ion- beam assistance and annealing on output power of He- Cd laser reflector[J]. Chinese J Lasers, 2013, 40(11): 1107001.

[7] [7] Willamowski U, Grofi T, Ristau D, et al.. Calorimetric measurement of optical absorption and transmissivity with sub ppm sensitivity [C]. SPIE, 1996, 2775: 147-148.

[8] [8] Yin Qingrui, Wang Tong, Qian Menglu. Acousto- Optic Photo- Thermal Technique and Application[M]. Beijing: Science Press, 1991: 62-65.

[9] [9] Zhao Ling, Wu Xiaoye, Gu Yongqiang, et al.. Measuring the absorptance of deep ultraviolet fluoride coatings with laser calorimetry [J]. Chinese J Lasers, 2014, 41(8): 0807001.

[10] [10] Wu Z L, Kuo P K, Lu Y S, et al.. Absorption measurement of thin films by using photothermal techniques[C]. SPIE, 1995, 2714: 294.

[11] [11] Fan Shuhai, He Hongbo, Fan Zhengxiu, et al.. Theory and experiment of surface thermal lens technique used in absorption measurement of thin films[J]. Acta Physica Sinica, 2005, 54(12): 5774-5777.

[12] [12] Hu Haiyang, Fan Zhengxiu, Zhao Qiang. Mearsuring weak absorption of thin film coatings by surface thermal lensing technique[J]. Acta Optica Sinica, 2001, 21(2): 150-154.

[13] [13] Wang Yingjian, Hu Haiyang, Li Qingguo, et al.. The study of weak absorption of the high reflection thin films coated on the Si plates at 1315 nm by STL [J]. High Power Laser and Particle Beams, 2000, 12(s0): 87-90.

[14] [14] Satio H, Irikura M, Haraguchi M, et al.. New type of photothermal spectroscopic technique[J]. Appl Opt, 1992, 31(12): 2047.

[15] [15] Li B, Xiong S, Zhang Y. Fresnel diffraction model for mode-mismatched thermal lens with top-hat beam excitation[J]. Appl Phys B, 2005, 80(4-5): 527-531.

[16] [16] Liu M Q, Li B C, Wang Y R. Accurate determination of subnanoscale deformation with combined laser calorimetry and surface thermal lens[J]. Appl Phys Lett, 2009, 94(13): 131905.

[17] [17] Jackson W B, Amer N M, Boccara A C, et al.. Photothermal deflection spectroscopy and detection[J]. App Opt, 1981, 20(8): 1333-1344.

[18] [18] Fan Shuhai. High Sensitive Weak Absorption Apparatus for Optical Coatings[D]. Shanghai: Shanghai Institute of Optics and Fine Mechanics, 2005: 39-48.

[19] [19] Zhang Yingcong, Shen Hua, Zhu Rihong. Three-dimensional temperature field of material irradiated by continuous wave laser[J]. Chinese J Lasers, 2013, 40(8): 0806002.

[20] [20] Li B C, Eberhard W. Probe-beam diffraction in a pulsed top hat beam thermal lens with a mode-mismatched configuration[J]. Appl Opt, 1999, 38(24): 5241-5249.