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Chinese Optics Letters, Volume. 6, Issue 8, 568(2008)

Real-time measurement of the fast axis angle of a quarter-wave plate based on simultaneous phase shifting technique

Kun Yang1,2、*, Aijun Zeng3, Xiangzhao Wang2, Hua Wang1,2, and Feng Tang1
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049
  • 3Shanghai Hengyi Optics and Fine Mechanics Co., Ltd., Shanghai 201800
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    References(14)

    [1] [1] A. Zeng, X. Wang, Z. Dong, X. Jiang, L. Huang, and D. Li, Chinese J. Lasers (in Chinese) 32, 1063 (2005).

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    [6] [6] Z. Wang, Q. Li, Q. Tan, Z. Huang, and J. Shi, Measurement 39, 729 (2006).

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    [10] [10] T. C. Oakberg, Proc. SPIE 3121, 19 (1997).

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    CLP Journals

    [1] Wei Wang, Jianzhong Chen, Zhongbo Liu, "Spectral technique for measuring phase retardation of a wave plate," Chin. Opt. Lett. 13, 012601 (2015)

    [2] Yang Kun, Wang Xiangzhao. Null Ellipsometry Based on Photoelastic Modulation[J]. Chinese Journal of Lasers, 2009, 36(s2): 215

    [3] Tong Zhang, Qibo Feng, Cunxing Cui, Bin Zhang, "Research on error compensation method for dual-beam measurement of roll angle based on rhombic prism (Invited Paper)," Chin. Opt. Lett. 12, 071201 (2014)

    Cited By

    [1] Wei Wang, Zhiqiang Liang, Chang Li, Yanyan Yin, Shiliang Wu. Two-Intensity Measurement Method for Determining the Fast Axis and Phase Retardation of a Wave Plate. 2012 Symposium on Photonics and Optoelectronics, 1(2012).

    [2] Wei Wang, Hong Zhu, Zhiqiang Liang. A Method for Simultaneously Measuring Phase Retardation and Fast Axis of Any Wave Plate. 2011 Symposium on Photonics and Optoelectronics (SOPO), 1(2011).

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    Kun Yang, Aijun Zeng, Xiangzhao Wang, Hua Wang, Feng Tang, "Real-time measurement of the fast axis angle of a quarter-wave plate based on simultaneous phase shifting technique," Chin. Opt. Lett. 6, 568 (2008)

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    Paper Information

    Received: Feb. 29, 2008

    Accepted: --

    Published Online: Sep. 2, 2008

    The Author Email: Kun Yang (yyyk2002@163.com)

    DOI:10.3788/COL20080608.0568

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology