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Spectroscopy and Spectral Analysis, Volume. 35, Issue 5, 1320(2015)

Differential Reflectance Spectroscopy for In-Situ Monitoring of Organic Thin Films Growth in Vacuum Environment

YAO Yao*, HU Chun-guang, XU Zhen-yuan, ZHANG Lei, FU Xing, and HU Xiao-tang
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    YAO Yao, HU Chun-guang, XU Zhen-yuan, ZHANG Lei, FU Xing, HU Xiao-tang. Differential Reflectance Spectroscopy for In-Situ Monitoring of Organic Thin Films Growth in Vacuum Environment[J]. Spectroscopy and Spectral Analysis, 2015, 35(5): 1320

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    Paper Information

    Received: Apr. 25, 2014

    Accepted: --

    Published Online: May. 26, 2015

    The Author Email: Yao YAO (yaoyao714@tju.edu.cn)

    DOI:10.3964/j.issn.1000-0593(2015)05-1320-05

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology