Athermalized Infrared Hybrid Optical System by Employing Diffractive Element

[in Chinese]; [in Chinese]

Acta Optica Sinica, Volume. 21, Issue 11, 1364(2001)

[in Chinese]^1,2 and [in Chinese]²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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References(7)

[1] [1] Rogers P J. Athermalized FLIR optics. Proc. SPIE, 1990, 1354:742～751.

[2] [2] Gibbons R C. Compact high cold shield efficiency optical systems. U. S. Patent 4431917, 1984-02-14

[3] [3] Tamagawa Y. Multilens system with design with an athermal chart. Appl. Opt., 1994, 33(34):8009～8013

[6] [6] Jamleson T H. Thermal effects in optical systems. Opt. Engng., 1981, 20(2):156～160

[7] [7] Behrmann G P, Bown J P. Influence of temperature on diffractive lens performance. Appl. Opt., 1993, 32(14):2483～2489

[8] [8] Herzig H P. Micro-Optics. London:Taylor & Francis Ltd.,1997.259～281

[9] [9] Wood A P. Design of infrared hybrid refractive-diffractive lenses. Appl. Opt., 1992, 31(13):2253～2258

CLP Journals

[1] Yang Xiaoru, Zhang Liang, Wang Xijun, Liu Yu. A High Resolution Shortwave Infrared Passive Athermalization System with Wide Temperature Range[J]. Laser & Optoelectronics Progress, 2012, 49(1): 12204

[2] Liu Feng, Xu Xiping, Sun Xiangyang, Duan Jie. Design of Infrared (IR) Hybrid Refractive/Diffractive Lenses for Target Detecting/Tracking[J]. Acta Optica Sinica, 2010, 30(7): 2084

[3] Chen Xiao, Yang Jianfeng, Ma Xiaolong, Bai Yu, He Jike, He Jianwei. Athermalization Design of Wide Temperature Range for Hybrid Refractive-Diffractive Objective in 8-12 μm[J]. Acta Optica Sinica, 2010, 30(7): 2089

[4] Zhang Yu, Wang Wensheng. Design of Cooled Infrared Dual-Band Common Path Refractive-Diffractive Telephoto Objective[J]. Acta Optica Sinica, 2013, 33(5): 522006

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jul. 4, 2000

Accepted: --

Published Online: Aug. 10, 2006

The Author Email:

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology