Thermo-optic characterization of thin-film lithium niobate asymmetric Mach–Zehnder interferometer from 290 to 10 K

Hailong Han; Hongxin Xu; Jiamin Xiong; Jia Huang; Pusheng Yuan; Huiqin Yu; Shuna Wang; Lingyun Li; Xiaoping Liu; Hao Li; Lixing You

doi:10.3788/COL202523.051302

Chinese Optics Letters, Volume. 23, Issue 5, 051302(2025)

Thermo-optic characterization of thin-film lithium niobate asymmetric Mach–Zehnder interferometer from 290 to 10 K

Hailong Han1...2, Hongxin Xu1,2, Jiamin Xiong1,2, Jia Huang1,2, Pusheng Yuan1,2, Huiqin Yu1,2, Shuna Wang1,2, Lingyun Li1,2, Xiaoping Liu3, Hao Li1,2,*, and Lixing You12 |Show fewer author(s)

Author Affiliations

¹Shanghai Key Laboratory of Superconductor Integrated Circuit Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China

²National Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China

³School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China

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References(21)

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Hailong Han, Hongxin Xu, Jiamin Xiong, Jia Huang, Pusheng Yuan, Huiqin Yu, Shuna Wang, Lingyun Li, Xiaoping Liu, Hao Li, Lixing You, "Thermo-optic characterization of thin-film lithium niobate asymmetric Mach–Zehnder interferometer from 290 to 10 K," Chin. Opt. Lett. 23, 051302 (2025)

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