Chinese Optics Letters, Volume. 16, Issue 10, 101201(2018)

Absolute surface form measurement of flat optics based on oblique incidence method

Longbo Xu1, Shijie Liu2、*, Rihong Zhu1、**, You Zhou2, and Jie Chen2
Author Affiliations
  • 1Nanjing University of Science and Technology, Nanjing 210094, China
  • 2Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • show less
    Cited By

    Article index updated: Feb. 25, 2025

    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 5 article(s) from Web of Science.
    Tools

    Get Citation

    Copy Citation Text

    Longbo Xu, Shijie Liu, Rihong Zhu, You Zhou, Jie Chen, "Absolute surface form measurement of flat optics based on oblique incidence method," Chin. Opt. Lett. 16, 101201 (2018)

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: May. 23, 2018

    Accepted: Aug. 16, 2018

    Posted: Aug. 17, 2018

    Published Online: Oct. 12, 2018

    The Author Email: Shijie Liu (shijieliu@siom.com), Rihong Zhu (zhurihong@njust.edu.cn)

    DOI:10.3788/COL201816.101201

    Topics