Researching | Wave Plate Phase Measurement Method Based on Vortex Encoding Technology

Laser & Optoelectronics Progress, Volume. 59, Issue 21, 2112001(2022)

Wave Plate Phase Measurement Method Based on Vortex Encoding Technology

Zetian Huang, Runkun Li, Le Wang, and Yanghui Li^*

Author Affiliations

College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, Zhejiang, China

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Figures&Tables (7)

References (16)

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Figures & Tables(7)

Fig. 1. Optical path diagram of measurement principle

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Fig. 2. Two-dimensional model of azimuth angle $ψ$ and phase delay $η$

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Fig. 3. Oval hollow focused spots. (a) Light spot when phase delay is 0°; (b) light spot when phase delay is 45°

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Fig. 4. First-order derivative of phase difference

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Fig. 5. First-order derivative of phase delay

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Table 1. Absolute errors and relative errors under different angles α
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Table 1. Absolute errors and relative errors under different angles α
Included angle α /（°） Absolute error /（°） Relative error /%
9 7.61 16.91
18 6.43 14.29
27 4.67 10.38
36 2.41 5.36
45 0.17 0.38

Table 2. Absolute errors and relative errors under different phase delays
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Table 2. Absolute errors and relative errors under different phase delays
Wave plate phase retardation η /（°） Absolute error /（°） Relative error /%
9 0.02 0.22
18 0.03 0.16
27 0.04 0.11
36 0.11 0.31
45 0.27 0.60

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Zetian Huang, Runkun Li, Le Wang, Yanghui Li. Wave Plate Phase Measurement Method Based on Vortex Encoding Technology[J]. Laser & Optoelectronics Progress, 2022, 59(21): 2112001

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Aug. 19, 2021

Accepted: Nov. 1, 2021

Published Online: Oct. 24, 2022

The Author Email: Yanghui Li (lyh@cjlu.edu.cn)

DOI:10.3788/LOP202259.2112001

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology