Chinese Journal of Liquid Crystals and Displays, Volume. 36, Issue 3, 412(2021)

Investigation on exposure Mura in TFT process

HUANG Shuang-shuang*, YU Yue, MA Guo-yong, ZHAO Hui, GAO Wen, SHEN Jian-hua, CHEN Ping, YANG Zhi-lin, LI Lian-feng, and MA Xin-xing
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    References(1)

    [7] [7] PAZ V F, KOHLENBECKER S, PERSIDIS E. Sparkle characterization of anti-glare layers on displays with a grey value histogram analysis [J]. SID Symposium Digest of Technical Papers, 2018, 49(1): 76-79.

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    HUANG Shuang-shuang, YU Yue, MA Guo-yong, ZHAO Hui, GAO Wen, SHEN Jian-hua, CHEN Ping, YANG Zhi-lin, LI Lian-feng, MA Xin-xing. Investigation on exposure Mura in TFT process[J]. Chinese Journal of Liquid Crystals and Displays, 2021, 36(3): 412

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    Paper Information

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    Received: Jun. 11, 2020

    Accepted: --

    Published Online: Sep. 3, 2021

    The Author Email: HUANG Shuang-shuang (huangshuangshuang@ncpd.com.cn)

    DOI:10.37188/cjlcd.2020-0146

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