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Laser & Optoelectronics Progress, Volume. 54, Issue 11, 111001(2017)

Gradient Constrained Microscopic Imaging Quality Improvement Method with Objective Lens Measurement

Huang Yilong1, Zhao Jufeng1、*, Zhang Keqi2, Hua Weiping1, and Cui Guangmang1
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    Article index updated: Sep. 14, 2025

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    Huang Yilong, Zhao Jufeng, Zhang Keqi, Hua Weiping, Cui Guangmang. Gradient Constrained Microscopic Imaging Quality Improvement Method with Objective Lens Measurement[J]. Laser & Optoelectronics Progress, 2017, 54(11): 111001

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    Paper Information

    Category: Image Processing

    Received: Apr. 15, 2017

    Accepted: --

    Published Online: Nov. 17, 2017

    The Author Email: Zhao Jufeng (dabaozjf@hdu.edu.cn)

    DOI:10.3788/lop54.111001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology