Infrared and Laser Engineering, Volume. 54, Issue 8, 20250126(2025)
Infrared thermal imaging coating debonding defect detection excited by halogen lamp array
Fig. 1. Simulation of the irradiance distribution of a single lamp
Fig. 2. Simulation of irradiance distribution of two lamps (spacing 10 cm)
Fig. 3. Simulation of irradiance distribution of two lamps (spacing 4.5 cm)
Fig. 4. Simulation of the irradiance distribution of the lamp array
Fig. 6. Temperature images at different moments(Single halogen lamp)
Fig. 8. Temperatures at different times at the midpoint of the specimen(Single halogen lamp)
Fig. 9. Temperature images at different moments(Halogen lamp array)
Fig. 11. Temperature at different times at the midpoint of the specimen(Halogen lamp array)
Fig. 13. Temperature plots of a single halogen lamp as an excitation source at different times
Fig. 14. Halogen lamp array as an excitation source at different time temperature plot
Fig. 15. Standard specimens for internal defects in absorbing CFRP substrates
Fig. 17. Halogen lamp periodic thermal imaging experimental system
Fig. 18. Algorithm processing result diagram (single lamp excitation source)
Fig. 19. Algorithm processing result diagram (halogen lamp array excitation source)
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Haiming DENG, Baoyuan DENG, Hongjin WANG, Xiaofei ZHANG, Yunze HE. Infrared thermal imaging coating debonding defect detection excited by halogen lamp array[J]. Infrared and Laser Engineering, 2025, 54(8): 20250126
Category: Infrared
Received: Feb. 25, 2025
Accepted: --
Published Online: Aug. 29, 2025
The Author Email: Baoyuan DENG (dengbaoyuan@outlook.com)