Laser & Optoelectronics Progress, Volume. 56, Issue 15, 152201(2019)

Optical Design of Total-Reflective Ultra-Short-Pulse Measurement System

Guangzhen Cheng1, Liuyang Zhang1、*, Shaozhi Pu1, Yuqiu Qu2, Qianru Li1, and Ze Yu1
Author Affiliations
  • 1 College of Applied Science, Harbin University of Science and Technology, Harbin, Heilongjiang 150080, China
  • 2 College of Physics Science and Technology, Heilongjiang University, Harbin, Heilongjiang 150080, China
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    References(19)

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    [7] Trebino R. DeLong K W, Fittinghoff D N, et al. Measuring ultrashort laser pulses in the time-frequency domain using frequency-resolved optical gating[J]. Review of Scientific Instruments, 68, 3277-3295(1997).

    [10] Gallmann L, Sutter D H, Matuschek N et al. Characterization of sub-6-fs optical pulses with spectral phase interferometry for direct electric-field reconstruction[J]. Optics Letters, 24, 1314-1316(1999).

    [16] O'Shea P. Kimmel M, Gu X, et al. Highly simplified device for ultrashort-pulse measurement[J]. Optics Letters, 26, 932-934(2001).

    [18] O'Shea P. Kimmel M, Gu X, et al. Highly simplified device for ultrashort-pulse measurement[J]. Optics Letters, 26, 932-934(2001).

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    Guangzhen Cheng, Liuyang Zhang, Shaozhi Pu, Yuqiu Qu, Qianru Li, Ze Yu. Optical Design of Total-Reflective Ultra-Short-Pulse Measurement System[J]. Laser & Optoelectronics Progress, 2019, 56(15): 152201

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Feb. 19, 2019

    Accepted: Mar. 7, 2019

    Published Online: Aug. 5, 2019

    The Author Email: Liuyang Zhang (johnien@163.com)

    DOI:10.3788/LOP56.152201

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