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Microelectronics, Volume. 51, Issue 3, 390(2021)

Research Progress of 1/f Noise Charateristics in Advanced MOSFETs

MA Ting1, REN Fang1, XIA Shiqin1, LIAO Xiyi1, and ZHANG Peijian2
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    MA Ting, REN Fang, XIA Shiqin, LIAO Xiyi, ZHANG Peijian. Research Progress of 1/f Noise Charateristics in Advanced MOSFETs[J]. Microelectronics, 2021, 51(3): 390

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    Paper Information

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    Received: Dec. 16, 2020

    Accepted: --

    Published Online: Mar. 11, 2022

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.200584

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology