Advanced Photonics Nexus, Volume. 2, Issue 2, 026003(2023)
Real-time monitoring of polarization state deviations with dielectric metasurfaces
[7] H. G. Tompkins, J. N. Hilfiker. Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization(2015).
[9] M. Chekhova, P. Banzer. Polarization of Light in Classical, Quantum, and Nonlinear Optics(2021).
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Shaun Lung, Jihua Zhang, Kai Wang, Andrey A. Sukhorukov, "Real-time monitoring of polarization state deviations with dielectric metasurfaces," Adv. Photon. Nexus 2, 026003 (2023)
Category: Research Articles
Received: Oct. 12, 2022
Accepted: Dec. 31, 2022
Published Online: Feb. 6, 2023
The Author Email: Zhang Jihua (jhzhanghust@gmail.com)