Fig. 1. Spatial heterodyne spectrometer. (a) Schematic of optical path; (b) monolithic SHS interferometer

Fig. 2. Variation of interference intensity in the direction of dispersion at different wavelengths

Fig. 3. Relationship between wavenumber and modulation

Fig. 4. Simulation results

Fig. 5. Transmittance curve of the flat-field correction filter

Fig. 6. Layout of experimental breadboard

Fig. 7. Relative illumination curve of the system(selected characteristic wavelengths of the interference working filter and flat-field filter are 1575 nm and 1500 nm, respectively)

Fig. 8. Experimental results. (a) Interferogram of flat-field filter; (b) interferogram of working filter

Fig. 9. Comparison between single-row flat-field data and interference data

Fig. 10. Comparison of flat-field correction effect. (a) Interferogram before flat-field correction; (b) interferogram after flat-field correction

Fig. 11. Comparison of single-row interference data before and after flat-field correction

Fig. 12. Effect of flat-field correction on recovery spectrum