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Acta Optica Sinica, Volume. 38, Issue 12, 1223001(2018)

Narrow-Band Polarization Notch Filtering of Visible Light Spectra Based on Photonic Crystal with Periodic Rectangular Holes

Qifan Zhu1,2、*, Yuegang Fu1,2、*, and Zhiying Liu1,2
Author Affiliations
  • 1 Key Laboratory of Opto-Electronic Measurement and Optical Information Transmission Technology of Ministry of Education, Changchun University of Science and Technology, Changchun, Jilin 130022, China
  • 2 School of Opto-Electronic, Changchun University of Science and Technology, Changchun, Jilin 130022, China
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    AbstractGet PDF(in Chinese)
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    Schematic of photonic crystal with periodic rectangular holes. (a) Three-dimensional model; (b) two-dimensional model in x-y plane

    Fig. 1. Schematic of photonic crystal with periodic rectangular holes. (a) Three-dimensional model; (b) two-dimensional model in x-y plane

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    Schematic of model. (a) Singly periodic structure; (b) equivalent layered structure

    Fig. 2. Schematic of model. (a) Singly periodic structure; (b) equivalent layered structure

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    Equivalent refractive index versus filling ratio f of grating layer

    Fig. 3. Equivalent refractive index versus filling ratio f of grating layer

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    Notch filtering features of visible light spectra versus filling ratio f of grating layer and wavelength. (a) s polarization; (b) p polarization

    Fig. 4. Notch filtering features of visible light spectra versus filling ratio f of grating layer and wavelength. (a) s polarization; (b) p polarization

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    Notch filtering features of visible light spectra versus thickness d and wavelength. (a) p polarization; (b) s polarization

    Fig. 5. Notch filtering features of visible light spectra versus thickness d and wavelength. (a) p polarization; (b) s polarization

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    Notch filtering features of visible light spectra with central wavelengths of 435, 485, 535, 585, 635, 685 nm versus filling ratio f

    Fig. 6. Notch filtering features of visible light spectra with central wavelengths of 435, 485, 535, 585, 635, 685 nm versus filling ratio f

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    Transmittance at central wavelength versus periodic layer number m when filling ratios are 0.1, 0.2, 0.3, 0.4, 0.5, 0.6, 0.7, 0.8, 0.9. (a) p polarization; (b) s polarization

    Fig. 7. Transmittance at central wavelength versus periodic layer number m when filling ratios are 0.1, 0.2, 0.3, 0.4, 0.5, 0.6, 0.7, 0.8, 0.9. (a) p polarization; (b) s polarization

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    Notch filtering features of visible light spectra under different central wavelengths. (a) 417 nm; (b) 497 nm; (c) 582 nm; (d) 685 nm

    Fig. 8. Notch filtering features of visible light spectra under different central wavelengths. (a) 417 nm; (b) 497 nm; (c) 582 nm; (d) 685 nm

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    • Table 1. Notch filtering band widths for p polarization and s polarization when filling ratios f are 0.37, 0.5, 0.75 and central wavelengths are different nm

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      Table 1. Notch filtering band widths for p polarization and s polarization when filling ratios f are 0.37, 0.5, 0.75 and central wavelengths are different nm

      λ0f=0.37f=0.5f=0.75
      BpBsBpBsBpBs
      435191113751
      485211215852
      535241317752
      585261418872
      635281619972
      6853017211073

    • Table 2. Layer number, notch band width B and minimum transmittance Tmin for p polarization and s polarization under different filling ratios

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      Table 2. Layer number, notch band width B and minimum transmittance Tmin for p polarization and s polarization under different filling ratios

      fp polarizations polarization
      mB /nmTminmB /nmTmin
      0.12931034280
      0.23428047200
      0.34123066140
      0.45118096100
      0.56614014960
      0.69410020030
      0.71506020010
      0.820010200-0.3071
      0.9200-0.2864200-0.9478
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    Qifan Zhu, Yuegang Fu, Zhiying Liu. Narrow-Band Polarization Notch Filtering of Visible Light Spectra Based on Photonic Crystal with Periodic Rectangular Holes[J]. Acta Optica Sinica, 2018, 38(12): 1223001

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    Paper Information

    Category: Optical Devices

    Received: Jun. 29, 2018

    Accepted: Jul. 25, 2018

    Published Online: May. 10, 2019

    The Author Email:

    DOI:10.3788/AOS201838.1223001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology