NOVEL THERMAL CYCLE SCREENING EQUIPMENT FOR CRYOGENIC SEMICONDUCTOR COMPONENTS WU Li-Gang LIU Da-Fu ZHU San-Gen WU Jia-Rong HONG Si-Min GONG Hai-Mei

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journal of Infrared and Millimeter Waves, Volume. 25, Issue 2, 153(2006)

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

Author Affiliations

[in Chinese]

show less

References(2)

[2] [2] YAN Qi,Rex Lam,et al.Temperature profile effects in accelerated thermal cycling of SnPb and Pb-free solder joints[ J ].Microelectronics Reliability,2006,46 (2-4):574-588.

[3] [3] Ikuo Shohji,Hideo Mori,et al.Solder joint reliability evaluation of chip package using a modified Coffin-Manson equation [ J ].Microelectronics Reliability,2005,44 (2):269-274

CLP Journals

[1] Cao Lan, Deng Ruohan, Gong Haimei. Automated vacuum system for lifetime test of IR detectors[J]. Infrared and Laser Engineering, 2015, 44(6): 1712

Tools

Get Citation

Copy Citation Text

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. NOVEL THERMAL CYCLE SCREENING EQUIPMENT FOR CRYOGENIC SEMICONDUCTOR COMPONENTS WU Li-Gang LIU Da-Fu ZHU San-Gen WU Jia-Rong HONG Si-Min GONG Hai-Mei[J]. Journal of Infrared and Millimeter Waves, 2006, 25(2): 153

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category:

Received: Mar. 23, 2005

Accepted: --

Published Online: Jul. 5, 2006

The Author Email:

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology