Infrared Technology, Volume. 47, Issue 5, 584(2025)
Sparse Depth Feature Infrared Image Stitching Algorithm
[4] [4] Lowe D G. Distinctive Image features from scale-invariant key points[J].International Journal of Computer Vision, 2004,60(2): 91-110.
[7] [7] Rosten E, Porter R, Drummond T. Faster and better: a machine learning approach to corner detection[J].IEEE Trans Pattern Anal Mach Intell, 2008,32(1): 105-119.
[9] [9] Rublee E, Rabaud V, Konolige K, et al. ORB: An efficient alternative to SIFT or SURF[C]//ICCV, 2011,11(1): 2564-2571.
[11] [11] Bay H, Tuytelaars T, Gool L V. SURF: speeded up robust features[C]//European Conference on Computer Vision, 2006: 404-417.
[15] [15] YAN Ni, MEI Yupeng, XU Ling, et al. Deep learning on image stitching with multi-viewpoint images: a survey[J].Neural Processing Letters, 2023,55(4): 3863-3898.
[16] [16] LE Hoang, LIU Feng, ZHANG Shu, et al. Deep homography estimation for dynamic scenes[C]//Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2020, 7649-7658.
[18] [18] HONG Mingbo, LU Yuhang, YE Nianjin, et al. Unsupervised homography estimation with coplanarity-aware gan[C]//Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2022: 17642-17651.
[19] [19] ZHOU Hongfei, ZHU Yuhe, LV Xiaoqian, et al. Rectangular-output image stitching[C]//2023IEEE International Conference on Image Processing(ICIP), 2023: 2800-2804.
[21] [21] Dusmanu M, Rocco I, Pajdla T, et al. D2-Net: a trainable CNN for joint detection and description of local features[J].CoRR, 2019, abs/1905.03561.
[22] [22] Cover Thomas M, Peter E. Hart. Nearest neighbor pattern classification[J].IEEE Trans. Inf. Theory, 1967(13): 21-27。
[23] [23] LI Feifei, JIA Deng, KAI Li. ImageNet: constructing a large-scale image database[J].Journal of Vision, 2010,9(8): 1037-1037.
[24] [24] Christopher W, Omar A, N D B, et al. Megadepth: efficient coverage quantification for BigWigs and BAMs[J].Bioinformatics, 2021,37(18): 3014-3016.
[25] [25] Fischler M A, Bolles R C. Random sample consensus: a paradigm for model fitting with applications to image analysis and automated cartography[J].Communications of the ACM, 1981,24(6): 381-395.
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HU Junwei, WANG Shiwei, YANG Moyuan. Sparse Depth Feature Infrared Image Stitching Algorithm[J]. Infrared Technology, 2025, 47(5): 584