Fig. 1. Calculation and simulation results of refractive index and light field distribution of epitaxial structure

Fig. 2. Calculated vertical far-field distribution

Fig. 3. Influence of reflectivity of anti-reflection film on laser performance parameters at different chip cavity lengths. (a) PCE; (b) threshold current; (c) slope efficiency

Fig. 4. Measured optical power and PCE versus operating current for COS before optimization

Fig. 5. Measured optical power and PCE versus operating current for COS after optimization

Fig. 6. Power and voltage of device versus current before and after optimization

Fig. 7. Measured far-field distributions of COS when operating current is 23 A

Fig. 8. Energy ratios under different slow-axis far-field divergence angles at 23 A current

Fig. 9. Measured spectrum at 23 A current

Fig. 10. Power record curves in accelerated lifetime test