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Laser & Optoelectronics Progress, Volume. 57, Issue 22, 221106(2020)

Fourier Ptychographic Microscopy Reconstruction Based on Deep Learning

Yican Chen, Xia Wu*, Zhi Luo, Huidong Yang, and Bo Huang*
Author Affiliations
  • College of Information Science and Technology, Jinan University, Guangzhou, Guangdong 510632, China
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    Article index updated: Sep. 12, 2025

    The article is cited by 3 article(s) CLP online library. (Some content might be in Chinese.)
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    Yican Chen, Xia Wu, Zhi Luo, Huidong Yang, Bo Huang. Fourier Ptychographic Microscopy Reconstruction Based on Deep Learning[J]. Laser & Optoelectronics Progress, 2020, 57(22): 221106

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    Paper Information

    Category: Imaging Systems

    Received: Mar. 26, 2020

    Accepted: Apr. 27, 2020

    Published Online: Oct. 24, 2020

    The Author Email: Xia Wu (wuxia_liao@qq.com), Bo Huang (wuxia_liao@qq.com)

    DOI:10.3788/LOP57.221106

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology