Chinese Journal of Lasers, Volume. 47, Issue 10, 1014001(2020)

Pulsed Terahertz Nondestructive Detection Tomography Based on Fringe Suppression Technology

Zhong Yifan1,2, Ren Jiaojiao1,2, Li Lijuan1,2, Zhang Dandan1,2, and Zhang Jiyang1,2
Author Affiliations
  • 1Key Laboratory of Optoelectric Measurement and Optical Information Transmission Technology of Ministry of Education, School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun, Jilin 130022, China
  • 2National Demonstration Center for Experimental Opto-Electronic Engineering Education, School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun, Jilin 130022, China
  • show less
    Figures & Tables(15)
    Principle diagram of THz-TDS
    FRP internal structure
    Defect design
    Optical path of terahertz waves in typical three-layer structure
    3D spectral data cube
    Local equivalent diagram of prototype
    Phase delay suppression graph
    THz time-domain signal power spectrum of FRP debonding simulation sample
    Long and wide B-Scan images of trapezoidal wedge groove positions. (a) 3# row B-Scan image; (b) 3# column B-Scan image; (c) 2# column B-Scan image; (d) 1# column B-Scan image
    Images obtained by THz reflection tomography for FRP at different flight time. (a) Flight time is 132.5 ps; (b) flight time is 166.3 ps; (c) flight time is 200.7 ps
    THz waveforms at three different depths at normal and defect regions. (a) Normal region; (b) wedged-groove defect region; (c) PTFE-film defect region
    FRP defect maps at different depths after image enhancement. (a) Upper layer; (b) middle layer; (c) lower layer
    THz time-domain waveforms after fringe suppression. (a) Waveform of upper defect after fringe suppression; (b) waveform of middle defect after fringe suppression;(c) waveform of lower defect after fringe suppression
    FRP defect maps at different depths after fringe suppression. (a) flight time is 134.2 ps; (b) flight time is 166.7 ps; (c) flight time is 200.7 ps
    • Table 1. Table of defect information

      View table

      Table 1. Table of defect information

      Defect typeDefect depth /mmDefect thickness /mm
      A1: 0.50.05
      PTFE-filmA2: 3.00.05
      A3: 5.00.05
      1.0
      Wedged-groove2.00.3
      3.0
    Tools

    Get Citation

    Copy Citation Text

    Zhong Yifan, Ren Jiaojiao, Li Lijuan, Zhang Dandan, Zhang Jiyang. Pulsed Terahertz Nondestructive Detection Tomography Based on Fringe Suppression Technology[J]. Chinese Journal of Lasers, 2020, 47(10): 1014001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: terahertz technology

    Received: Apr. 3, 2020

    Accepted: --

    Published Online: Oct. 9, 2020

    The Author Email:

    DOI:10.3788/CJL202047.1014001

    Topics