Chinese Journal of Lasers, Volume. 45, Issue 12, 1204005(2018)

Polarization Response of Retroreflector to Polarization-Modulated Light

Shuyuan Gao1,2、*, Junkai Shi2, Rongyi Ji2, Yao Li2, and Weihu Zhou1,2,3、*
Author Affiliations
  • 1 School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei, Anhui 230009, China
  • 2 Laboratory of Laser Measurement Technology, Academy of Opto-Electronics, Chinese Academy of Sciences, Beijing 100094, China
  • 3 University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(10)
    CAR representation of polarization-modulated light. (a) CAR curve of polarization-modulated light; (b) projection of CAR curve in complex plane
    Schematic of polarization modulation ranging system. (a) Structural diagram of optical paths in polarization modulation ranging system; (b) retroreflector in global coordinate system
    Response of BK7 solid retroreflector to polarization-modulated light. (a1)-(a6) Time domain response; (b) frequency domain response
    Response of Au film hollow retroreflector to polarization-modulated light. (a1)-(a6) Time domain response; (b) frequency domain response
    Effect of metal film on amplitude ratio of polarization-modulated light. (a) Au; (b) Ag; (c) Al
    Effect of metal film of different on phase delay of polarization-modulated light. (a) Au; (b) Ag; (c) Al
    Effect of pitching angle of Ag film retroreflector on amplitude ratio of polarization-modulated light
    Effect of pitching angle of Ag film retroreflector on phase delay of polarization-modulated light
    Effect of deflection angle of Ag film retroreflector on amplitude ratio of polarization-modulated light
    Effect of deflection angle of Ag film retroreflector on phase delay of polarization-modulated light
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    Shuyuan Gao, Junkai Shi, Rongyi Ji, Yao Li, Weihu Zhou. Polarization Response of Retroreflector to Polarization-Modulated Light[J]. Chinese Journal of Lasers, 2018, 45(12): 1204005

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    Paper Information

    Category: measurement and metrology

    Received: Jul. 10, 2018

    Accepted: Aug. 21, 2018

    Published Online: May. 9, 2019

    The Author Email:

    DOI:10.3788/CJL201845.1204005

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