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Photonics Research, Volume. 8, Issue 4, 610(2020)

Individually resolved luminescence from closely stacked GaN/AlN quantum wells

Bowen Sheng1,2, Gordon Schmidt1,6、*, Frank Bertram1, Peter Veit1, Yixin Wang2, Tao Wang2, Xin Rong2, Zhaoying Chen2, Ping Wang2, Jürgen Bläsing1, Hideto Miyake3, Hongwei Li4, Shiping Guo4, Zhixin Qin2, André Strittmatter1, Bo Shen2,5, Jürgen Christen1, and Xinqiang Wang2,5,7、*
Author Affiliations
  • 1Institute of Physics, Otto-von-Guericke-University Magdeburg, 39106 Magdeburg, Germany
  • 2State Key Laboratory for Mesoscopic Physics and Frontiers Science Center for Nano-optoelectronics, School of Physics, Peking University, Beijing 100871, China
  • 3Department of Electrical and Electronic Engineering, Mie University, Mie 514-8507, Japan
  • 4Advanced Micro-Fabrication Equipment Inc., Shanghai 201201, China
  • 5Collaborative Innovation Center of Quantum Matter, Peking University, Beijing 100871, China
  • 6e-mail: Gordon.Schmidt@ovgu.de
  • 7e-mail: wangshi@pku.edu.cn
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    Bowen Sheng, Gordon Schmidt, Frank Bertram, Peter Veit, Yixin Wang, Tao Wang, Xin Rong, Zhaoying Chen, Ping Wang, Jürgen Bläsing, Hideto Miyake, Hongwei Li, Shiping Guo, Zhixin Qin, André Strittmatter, Bo Shen, Jürgen Christen, Xinqiang Wang, "Individually resolved luminescence from closely stacked GaN/AlN quantum wells," Photonics Res. 8, 610 (2020)

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    Paper Information

    Category: Optical and Photonic Materials

    Received: Nov. 28, 2019

    Accepted: Feb. 17, 2020

    Published Online: Apr. 1, 2020

    The Author Email: Gordon Schmidt (Gordon.Schmidt@ovgu.de), Xinqiang Wang (wangshi@pku.edu.cn)

    DOI:10.1364/PRJ.384508

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology