Chinese Journal of Lasers, Volume. 48, Issue 9, 0903001(2021)

Investigation of Refractive Index Uniformity in Coatings on a Steep Lens

Weili Zhang1,3、*, Cao Feng1,2,3, Jian Sun1,3, Rui Zhu1,3, Jianguo Wang1,3, Xuefeng Shen1,3, Kui Yi1,3, Meiping Zhu1,3, and Jianda Shao1,3
Author Affiliations
  • 1Thin Film Optics Laboratory, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences Beijing 100049, China
  • 3Key Laboratory of High Power Laser Materials, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    Figures & Tables(18)
    Schematics of lens planetary rotation system. (a) Schematic; (b) top view
    Change of deposition angle during the rotation of the steep lens
    Variation range of deposition angle of the steep lens
    Transmittance curve of MgF2 films under different deposition angles (deposition temperature of 25 ℃)
    Reflectance curve of MgF2 films under different deposition angles (deposition temperature of 25 ℃)
    Refractive index dispersion curve of MgF2 films under different deposition angles (deposition temperature of 25 ℃)
    Variation of refractive index(at 200 nm) of MgF2 films with deposition angle (deposition temperature of 25 ℃)
    Schematic of self-shading effect
    Cross-sectional topography of MgF2 films under different deposition angles (deposition temperature of 25 ℃). (a) 0°; (b) 30°; (c) 60°; (d) 85°
    Transmittance curve of MgF2 films under different deposition angles (deposition temperature of 200 ℃)
    Reflectance curve of MgF2 films under different deposition angles (deposition temperature of 200 ℃)
    Refractive index dispersion curve of MgF2 films under different deposition angles(deposition temperature of 200 ℃)
    Refractive index at 200 nm of MgF2 films with deposition angle
    XRD spectra of two samples
    Influence of refractive index of MgF2 films on residual reflectance of 193 nm antireflection films (deposition temperature of 25 ℃)
    Influence of refractive index of MgF2 films on residual reflectance of 193 nm antireflection films (deposition temperature of 200 ℃)
    • Table 1. Variation range of deposition angle at different positions of steep lens

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      Table 1. Variation range of deposition angle at different positions of steep lens

      r /mm0102030405058.25
      Range of depositionangle /(°)1.41-40.062.08-48.982.40-58.481.53-68.41.25-79.1714.05-9028.54-90
      Average depositionangle /(°)27.0828.4331.9537.5345.656.868.27
    • Table 2. Film thickness of different samples

      View table

      Table 2. Film thickness of different samples

      Deposition angle /(°)Film thickness /nm
      Deposition temperature of 25 ℃Deposition temperature of 200 ℃
      0433385
      30380312
      60356258
      85310289
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    Weili Zhang, Cao Feng, Jian Sun, Rui Zhu, Jianguo Wang, Xuefeng Shen, Kui Yi, Meiping Zhu, Jianda Shao. Investigation of Refractive Index Uniformity in Coatings on a Steep Lens[J]. Chinese Journal of Lasers, 2021, 48(9): 0903001

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    Paper Information

    Category: materials and thin films

    Received: Nov. 30, 2020

    Accepted: Jan. 8, 2021

    Published Online: Apr. 30, 2021

    The Author Email: Zhang Weili (wlzhang@siom.ac.cn)

    DOI:10.3788/CJL202148.0903001

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