OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 23, Issue 1, 86(2025)

Constructing 2D Gaussian Complex Wavelets for 3D Measurement of Non-Uniformly Reflective Surfaces

ZHANG Man-qi, CHEN Wen-jing, and ZHANG Qi-can
Author Affiliations
  • College of Electronics and Information Engineering, Sichuan University, Chengdu 610065, China
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    References(9)

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    [12] [12] Abid A.Z, Gdeisat M.A, Burton D.R, et al. Spatial fringe pattern analysis using the two-dimensional continuous wavelet transform employing a cost function[J]. APPL OPTICS, 2007, 46(24): 6120-6126.

    [13] [13] Jiang C, Jia S, Dong J, et al. Multi-frequency fringe projection profilometry based on wavelet transform[J]. Opt Express, 2016, 24(11): 1323-1333.

    [16] [16] Han M, Chen W. Dual-angle rotation two-dimensional wavelet transform profilometry[J]. Opt Lett, 2022, 47(6): 1395-1398.

    [17] [17] Han M, Chen W. General framework of a two-dimensional complex wavelet for fringe projection profilometry[J]. Opt Express, 2023, 31(4): 5257-5272.

    [18] [18] Han M, Chen W. Two-dimensional complex wavelet with directional selectivity used in fringe projection profilometry[J]. Optics letters, 2021, 46(15): 3653-3656.

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    ZHANG Man-qi, CHEN Wen-jing, ZHANG Qi-can. Constructing 2D Gaussian Complex Wavelets for 3D Measurement of Non-Uniformly Reflective Surfaces[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2025, 23(1): 86

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    Paper Information

    Category:

    Received: Jul. 13, 2024

    Accepted: Feb. 25, 2025

    Published Online: Feb. 25, 2025

    The Author Email:

    DOI:

    CSTR:32186.14.

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