Opto-Electronic Engineering, Volume. 35, Issue 11, 101(2008)
Robustness Analysis of Image Registration Measures to Overlay Area Changing
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SHANGGUAN Jin-tai, GUO Hui, YUE Jin, YANG Ru-liang. Robustness Analysis of Image Registration Measures to Overlay Area Changing[J]. Opto-Electronic Engineering, 2008, 35(11): 101
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Received: Feb. 28, 2008
Accepted: --
Published Online: Mar. 1, 2010
The Author Email: Jin-tai SHANGGUAN (sxczsgjt@yahoo.com.cn)
CSTR:32186.14.