Chinese Journal of Lasers, Volume. 26, Issue 1, 21(1999)

Study of a High Precision Phase Shifter Employed in Phase Shifting Metrology

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(8)

    [1] [1] M. Takeda, H. Ina, S. Kobayashi. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry. J. Opt. Soc. Am., 1982, 72(1):156~160

    [2] [2] K. Creath. Phase-shifting speckle interferometry. App. Opt., 1985, 24(18):3053~3058

    [4] [4] H. Kadono, N. Takai, T. Asakura. New common-path phase shifting interferometer using a polarization technique. Appl. Opt., 1987, 26(5):898~904

    [5] [5] C. Y. Ai, J. C. Wyant. Effect of piezoelectric transducer nonlinearity on phase shift interferometry. Appl. Opt., 1987, 26(6):1112~1116

    [6] [6] Y. Y. Cheng. Phase shifter calibration in phase-shifting interferometry. Appl. Opt., 1985, 24(18):3049~3052

    [7] [7] Suezou Nakadate. Phase detection of equidistant fringes for highly sensitive optical sensing. Ⅰ. Principle and error analyses. J. Opt. Soc. Am. A, 1988, 5(8):1258~1264

    [8] [8] Suezou Nakadate. Phase detection of equidistant fringes for highly sensitive optical sensing. ⅠⅠ. Experiments. J. Opt. Soc. Am. A, 1988, 5(8):1265~1269

    [9] [9] Suezou Nakadate. High precision retardation measurement using phase detection of Young′s fringes. Appl. Opt., 1990, 29(2):242~246

    CLP Journals

    [1] QIN Yi, GONG Qiong, YANG Xing-qiang. A Method for Accurate Phase Shift in Two-step Phase-shifting Digital Holography[J]. Acta Photonica Sinica, 2011, 40(8): 1282

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of a High Precision Phase Shifter Employed in Phase Shifting Metrology[J]. Chinese Journal of Lasers, 1999, 26(1): 21

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    Paper Information

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    Received: Jul. 30, 1997

    Accepted: --

    Published Online: Aug. 9, 2006

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