Anti-Loss Characteristics of Continuous-Variable All-Optical Entanglement Swapping (Invited)

Xiaolan Liu; Shengshuai Liu; Jietai Jing

doi:10.3788/LOP250898

Laser & Optoelectronics Progress, Volume. 62, Issue 11, 1127020(2025)

Anti-Loss Characteristics of Continuous-Variable All-Optical Entanglement Swapping (Invited)

Xiaolan Liu¹, Shengshuai Liu^1,4、**, and Jietai Jing^1,2,3、*

¹State Key Laboratory of Precision Spectroscopy, Joint Institute of Advanced Science and Technology, School of Physics and Electronic Science, East China Normal University, Shanghai 200062, China

²CAS Center for Excellence in Ultra-Intense Laser Science, Shanghai 201800, China

³Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, Shanxi , China

⁴Chongqing Key Laboratory of Precision Optics, Chongqing Institute of East China Normal University, Chongqing 401120, China

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Fig. 1. Schematic of optical loss simulation

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Fig. 2. Scheme for anti-loss characteristics of all-optical quantum entanglement swapping. (a) Simplified diagram of the effect of losses on all-optical entanglement swapping; (b) double- $Λ$ energy level structure of ${}^{85} R b$ $D 1$ line

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Fig. 3. Smallest symplectic eigenvalue as a function of transmission efficiency $η$ ( $G_{1} = G_{2} = G$ , $G_{3} \to \infty$ 、 $η_{1} = η_{2} = η_{3} = η_{4} = η$ , $η_{5} = 0.5$ , and $α_{1} = α_{2} = 0.97$ )

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Fig. 4. Smallest symplectic eigenvalue as a function of transmission efficiency $η_{5}$ ( $G_{1} = G_{2} = G$ , $G_{3} \to \infty$ , $η_{1} = η_{2} = η_{3} = η_{4} = η$ , and $α_{1} = α_{2} = 0.97$ )

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Fig. 5. Smallest symplectic eigenvalue as a function of transmission efficiency $η_{5}$ ( $G_{1} = G_{2} = G$ , $G_{3} = 16$ , $η_{1} = η_{2} = η_{3} = η_{4} = η$ , and $α_{1} = α_{2} = 0.97$ )

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Xiaolan Liu, Shengshuai Liu, Jietai Jing. Anti-Loss Characteristics of Continuous-Variable All-Optical Entanglement Swapping (Invited)[J]. Laser & Optoelectronics Progress, 2025, 62(11): 1127020

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Paper Information

Category: Quantum Optics

Received: Mar. 25, 2025

Accepted: Apr. 28, 2025

Published Online: Jun. 17, 2025

The Author Email: Shengshuai Liu (ssliu@lps.ecnu.edu.cn), Jietai Jing (jtjing@phy.ecnu.edu.cn)

DOI:10.3788/LOP250898

CSTR:32186.14.LOP250898

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology