Researching | Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser

Chinese Journal of Lasers, Volume. 44, Issue 9, 901011(2017)

Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser

Xiong Jun^*, An Honghai, Jia Guo, Wang Wei, Wang Chen, Wang Ruirong, Fang Zhiheng, Dong Jiaqin, and Lei Anle

Author Affiliations

[in Chinese]

show less

Abstract Get PDF(in Chinese)

Figures&Tables (8)

References (19)

Paper Information

Figures & Tables(8)

Fig. 1. Schematic of Kirkpatrick-Baez (KB) microscopic imaging principle

Download full size

Fig. 2. Temporal histories for Kα radiation

Download full size

Fig. 3. Spatial distributions of Kα radiation in different time

Download full size

Fig. 4. Laser energy deposition and profile of electron temperature

Download full size

Fig. 5. Setup of experiment

Download full size

Fig. 6. Chlorinous K-shell spectrum

Download full size

Fig. 7. Images of X-ray emission in different directions. (a) X-ray emission area (forward-KB);(b) X-ray emission area (side-pinhole camera)

Download full size

Table 1. Five shot experiment data about relative intensity per laser energy

Table 1. Five shot experiment data about relative intensity per laser energy

Shot number	Target	P /(10¹⁴ W·cm^-2)	Image grayscale in CCD	Transmittance /%	Relative intensity (arb. units)
0209006	CH₂CHCl	0.74	890	1.8	233.8
0209007	CH₂CHCl	2.57	9200	1.8	657.8
0210011	CH₂CHCl	17	16700	1.8	1010.6
1104001	Ti	6.86	4400	83	38.5
1104002	Ti	4.84	2600	83	31.9

Tools

Get Citation

Copy Citation Text

Xiong Jun, An Honghai, Jia Guo, Wang Wei, Wang Chen, Wang Ruirong, Fang Zhiheng, Dong Jiaqin, Lei Anle. Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser[J]. Chinese Journal of Lasers, 2017, 44(9): 901011

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: laser devices and laser physics

Received: Apr. 26, 2017

Accepted: --

Published Online: Sep. 7, 2017

The Author Email: Xiong Jun (51854037@qq.com)

DOI:10.3788/CJL201744.0901011

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology