Chinese Journal of Lasers, Volume. 44, Issue 9, 901011(2017)

Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser

Xiong Jun*, An Honghai, Jia Guo, Wang Wei, Wang Chen, Wang Ruirong, Fang Zhiheng, Dong Jiaqin, and Lei Anle
Author Affiliations
  • [in Chinese]
  • show less

    Multi-keV X-rays are used as backlighting sources of the radiography to diagnose plasmas in high energy density physics (HEDP) experiments. We study the characteristics of Ti-4.7 keV and Cl-2.7 keV X-rays driven by nanosecond laser at the SG-II laser facility. The results show that the X-rays from Cl plasma are primarily He-like and H-like line radiation, with 2.7 keV He-α line on the strongest line emission. In addition, the relative intensity of Cl X-rays is more than an order of magnitude compared to that of Ti X-rays under the current SG-II laser conditions. Therefore, the Cl X-rays can be used as the backlighting diagnosis.

    Tools

    Get Citation

    Copy Citation Text

    Xiong Jun, An Honghai, Jia Guo, Wang Wei, Wang Chen, Wang Ruirong, Fang Zhiheng, Dong Jiaqin, Lei Anle. Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser[J]. Chinese Journal of Lasers, 2017, 44(9): 901011

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: laser devices and laser physics

    Received: Apr. 26, 2017

    Accepted: --

    Published Online: Sep. 7, 2017

    The Author Email: Xiong Jun (51854037@qq.com)

    DOI:10.3788/CJL201744.0901011

    Topics