Chinese Journal of Lasers, Volume. 44, Issue 9, 901011(2017)
Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser
Multi-keV X-rays are used as backlighting sources of the radiography to diagnose plasmas in high energy density physics (HEDP) experiments. We study the characteristics of Ti-4.7 keV and Cl-2.7 keV X-rays driven by nanosecond laser at the SG-II laser facility. The results show that the X-rays from Cl plasma are primarily He-like and H-like line radiation, with 2.7 keV He-α line on the strongest line emission. In addition, the relative intensity of Cl X-rays is more than an order of magnitude compared to that of Ti X-rays under the current SG-II laser conditions. Therefore, the Cl X-rays can be used as the backlighting diagnosis.
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Xiong Jun, An Honghai, Jia Guo, Wang Wei, Wang Chen, Wang Ruirong, Fang Zhiheng, Dong Jiaqin, Lei Anle. Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser[J]. Chinese Journal of Lasers, 2017, 44(9): 901011
Category: laser devices and laser physics
Received: Apr. 26, 2017
Accepted: --
Published Online: Sep. 7, 2017
The Author Email: Xiong Jun (51854037@qq.com)